A Dual-Sided Flying Prober is an advanced automated testing system designed for high-efficiency electrical validation of printed circuit boards (PCBs) and semiconductor devices. By utilizing movable probes on both top and bottom sides, it enables simultaneous dual-side testing without physical fixtures, significantly reducing cycle time and enhancing fault coverage in electronics manufacturing.
* Core Technical Features
1. Dual-Side Probing Mechanism
Multi-Probe Configuration: Equipped with 6 or 8 independent probes (e.g., 3–4 probes per side) that synchronously access test points on both PCB surfaces.
High-Precision Motion Control: Driven by linear motors and encoded servo systems, achieving positioning accuracy of ±3μm and repeatability within ±5μm.
2. Fixtureless Testing Capability
Dynamic Programmable Pathing: Probes autonomously navigate test points via CAD data input (e.g., Gerber/ODB++), eliminating need for custom fixtures.
Rapid Setup: Test programs generated in <30 minutes for prototype/low-volume batches, reducing lead time by 80% vs. bed-of-nails testing.
3. Advanced Testing Capabilities
Electrical Parameter Validation:
Tests continuity, shorts, resistance (±0.1%), capacitance (±0.5%), diode function, and inductance.